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High Frequency Measurements Site Index
High Frequency Measurements, electronic circuits, EMC, ESD
High Frequency Measurements in Electronic Circuits
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Внешние ссылки главной страницы ( 20 ) | |
circuitadvisor.com | - |
conta.cc/2kqluW2 | HF News January 30, 2017, ESD Issues |
systemsemc.com | EMC Design Advisory Service |
sigcon.com | <img> |
boulderdamhotel.com | click here |
esdrmv.com/ | RMV Technology Group |
conted.ox.ac.uk/courses/professional/index.php | <img> |
conted.ox.ac.uk/cpd/electronics/courses/high_frequency_measu... | - |
youtu.be/HOeVZM56XLk | Click here |
bcnv.org/ | click here |
securepayment.link/emcesd/ | <img> |
conta.cc/2kTXRJl | HF News for Feb 3, 2016 - Analog Design, ESD, and more |
conta.cc/2lRFK7t | HF News for March 13, 2017 - Ferrite for ESD/EFT/EMC |
conta.cc/2FYi4nY | My You Tube Channel and More |
devildash.com/ | Devil Dash |
eeweb.com/spotlight/interview-with-doug-smith | Click here |
shieldingforelectronics.com/ | Shielding for Electronics |
incompliancemag.com/article/shielded-vs-unshielded-square-ma... | Shielded vs. Unshielded Magnetic Loops for EMI/ESD Design and Troubleshooting |
hottconsultants.com/ | Henry Ott Consultants |
emcs.org | IEEE EMC Society |
Внутренние ссылки главной страницы ( 251 ) | |
#Topofpage | Top of Page |
hfmbook.htm | My book: High Frequency Measurements and Noise in Electronic Circuits |
seminars/semsched.htm | <img> |
consult.htm | <img> |
featlnks/index.htm | - |
Our%20offices,%20laboratory,%20and%20classrooms%20are%20loca... | - |
pdf/Tutor_Certificate300apw.pdf | click on the image |
bcsem_emcweek.htm | - |
bcsem_hfmeas.htm | Click here |
pictures/bouldercity/index.htm | Pictures of Boulder City, NV, USA, the main site of my public seminars |
webinars.htm | Click here |
webinars.htm/#Resonance | - |
HFNews/HFNews4.pdf | Click here for pdf version of March 13 HF News |
HFNews/HFNews5.pdf | - |
podcast/index.htm | Click here |
index.htm#upcoming | Click here |
pdf/Running_With_the_Devil.pdf | <img> |
audio/hfmadv.mp3 | Click here |
indxinfo.htm | Click here for more information, books, seminars, and consulting on high frequency measurement, design, troubleshooting, signal... |
instrmts.htm | Unique and Useful Instruments |
50mhzosc.htm | 50 MHz Oscillator |
1ghzprob.htm | DC to 1GHZ Oscilloscope Probe Plans |
pdf/cmpsim86.pdf | Computer Simulation of ESD and Lightning Events |
pdf/eos93.pdf | A New Type of Furniture ESD and Its Implications |
pdf/cd94scr.pdf | Balanced Probe Extends High-Frequency Measurements |
pdf/roma94.pdf | EMC Performance Comparison of Shielded and Unshielded Data Transmission Systems |
pdf/esd96-w.pdf | An Investigation into the Performance of the IEC 1000-4-4 Capacitive Clamp |
pdf/emc96.pdf | A New Method for Measuring the Shielding Effectiveness of Interconnections in Shielding Technologies: Application to Cellular Ph... |
pdf/emc97.pdf | A Method for Troubleshooting Noise Internal to an IC |
pdf/iprobe98.pdf | Current Probes, More Useful Than You Think |
pdf/emcgmr98.pdf | Damage to Magnetic Recording Heads due to Electromagnetic Interference |
pdf/emc99-w.pdf | Signal and Noise Measurement Techniques Using Magnetic Field Probes |
pdf/uesd99-w.pdf | Unusual Forms of ESD and Their Effects |
pages/tmw_esd/tmw1199.htm | Investigate System-Level ESD Problems |
pdf/eos00-w.pdf | ESD Immunity in System Designs, System Field Experiences and Effects of PWB Layout |
pdf/eos01-w.pdf | The EMI/ESD Environment of Large Server Installations |
pdf/shldmeas.pdf | A Method of Accurately Measuring Shielding Efffectiveness of Materials in Electronic Products |
pdf/2002-1B1.pdf | Sources of Impulsive EMI in Large Server Farms |
pdf/2002-1B2.pdf | ESD |
pdf/emcspecs.pdf | Interpreting Radiated Emission Specifications |
pdf/imaps07.pdf | Determining the Effects of Package Parasitics on SI and EMC Performance |
pdf/DC09_DCSmith.pdf | Noise Injection for Design Analysis and Debugging |
pdf/An_Unusual_Source_of_Multiple_ESD_Events_in_Electronic_E... | An Unusual Source of Multiple ESD Events in Electronic Equipment |
pdf/Techniques_for_Investigating_the_Effects_of_ESD_on_Elect... | Techniques for Investigating the Effects of ESD on Electronic Equipment |
pdf/2019_DesignCon_DCS.pdf | Predicting Field Failure From Small Environmental Stresses |
tt061999.htm | June 1999: The Dual Current Probe Problem |
tt070199.htm | July 1999: The Shorted Scope Probe Problem |
tt080699.htm | August 1999: The Paperclip Magnetic Probe |
tt091099.htm | September 1999: Measuring Voltages Using Current Probes |
tt101899.htm | October 1999: The Tapered Wall Cavity |
tt110199.htm | November 1999: Transient Suppression Plane |
tt120199.htm | December 1999: Can Ferrite Cores Increase Emissions? |
tt010100.htm | January 2000: Displaying Measurement Error |
tt020100.htm | February 2000, Measuring Capacitor Self-inductance and ESR |
tt030100.htm | March 2000, Improved Construction Technique for a 50 Ohm Termination |
tt040600.htm | April 2000, Paper Clips and the Speed of Light |
tt050100.htm | May 2000, Measuring Inductor Performance |
tt060100.htm | June 2000, 180 Degree Combiners |
tt061400.htm | June 2000 supplement, Ground Lead, Friend or Foe? |
tt070100.htm | July 2000, A Resistive Current Probe |
tt080100.htm | August 2000, Measuring Shielding Effectiveness of Materials |
tt090100.htm | September 2000, Copper Foil Tape, Anyone? |
tt100100.htm | October 2000, A Specialized Component |
tt110100.htm | November 2000, Measuring the Effects of High Frequency Noise Currents in Equipment |
tt120100.htm | December 2000, An Easy to Build Shielded Magnetic Loop Probe |
tt2001/tt010101.htm | January 2001, It's Just a Wire, Isn't It? |
tt2001/tt020101.htm | February 2001, Switching Power Supplies - Effects on Circuits, Magnetic Fields |
tt2001/tt030101.htm | March 2001, Switching Power Supplies - Common Mode Conducted Noise on Outputs |
tt2001/tt040101.htm | April 2001, Measurement Error Caused by Probe Input Impedance |
tt2001/tt050101.htm | May 2001, Hidden Threats to Electronic Equipment |
tt2001/tt060101.htm | June 2001, A Static Field Powered EMI Source |
tt2001/tt070101.htm | A Simple Shielding Effectiveness Measurement |
tt2001/tt080101.htm | August 2001, Differential Measurement of Cable EMI Currents |
tt2001/tt090101.htm | September 2001, Improving FET Probe Immunity to Unwanted Noise Pickup |
tt2001/tt100101.htm | October 2001, The Elusive Glitch |
tt2001/tt110101.htm | November 2001, The Elusive Glitch - Part 2 |
tt2001/tt120101.htm | December 2001, The Elusive Glitch - Part 3, Measurement of Impulsive Fields |
tt2002/tt010102.htm | January 2002, Cable Effects Part 1: Cable Discharge Events |
tt2002/tt020102.htm | February 2002, Cable Effects Part 2: Inductive Pickup by Cables in a System |
tt2002/tt030102.htm | March 2002, Cable Effects Part 3: Capacitive Pickup by Cables in a System |
tt2002/tt040102.htm | April 2002, Printed Wiring Board Coupling to a Nearby Metal Plane |
tt2002/tt050102.htm | May 2002, Printed Wiring Board Coupling to a Nearby Metal Plane, Part 2: ESD Immunity |
tt2002/tt060102.htm | June 2002, Using Mutual Inductance to Measure Voltage Drop in Circuits |
tt2002/tt070102.htm | July 2002, Inexpensive, but Useful Test Equipment |
tt2002/tt080102.htm | August 2002, Probe Input Impedance Revisited - Active Probes |
tt2002/tt090102.htm | September 2002, Kirchoff and Faraday Voltage Measurements - Don't Confuse Them |
tt2002/tt100102.htm | October 2002, Printed Wiring Board Coupling to a Nearby Metal Plane, Part 3: System Measurements |
tt2002/tt110102.htm | November 2002, Measuring Noise Voltage Across Seams in Enclosures |
tt2002/tt120102.htm | December 2002, Crossing Ground Plane Breaks, A Source of Crosstalk |
tt2003/tt010103.htm | January 2003, Crossing Ground Plane Breaks - Part 2, Tracing Current Paths |
tt2003/tt020103.htm | February 2003, Crossing Ground Plane Breaks - Part 3, Immunity to Radiated EMI |
tt2003/tt030103.htm | March 2003, Minimizing Errors in Oscilloscope Measurements |
tt2003/tt040103.htm | - |
tt2003/tt050103.htm | May 2003, Signal Paths Passing Through Ground and Power Planes, Effects on Immunity |
tt2003/tt060103.htm | June 2003, A Simple Horn Antenna for Emissions Troubleshooting |
tt2003/tt070103.htm | July 2003, Measuring E-Field Coupled IC Chip Noise |
tt2003/tt080103.htm | August 2003, Sin(x)/x, The Forgotten Setting - Part One |
tt2003/tt090103.htm | September 2003, Sin(x)/x, The Forgotten Setting - Part Two, An EMI Example |
tt2003/tt100103.htm | - |
tt2003/tt110103.htm | November 2003, Heisenberg and Signal Measurements - Part 2, The Frequency Domain |
tt2003/tt120103.htm | December 2003, Troubleshooting Noise from Pulse Width Modulation Controlled 3 Phase Motors and Controls |
tt2004/tt010104.htm | January 2004, Determining the Effects of Probing on Signals - Tuned Probe Simulators |
tt2004/tt020104.htm | February 2004, Measuring Printed Circuit Board Characteristic Impedance Without a TDR (when you need a close answer fast!) by Ch... |
tt2004/tt030104.htm | March 2004, Coupling Effects Between Equipment Enclosures (interactions with grounding conductors) |
tt2004/tt040204.htm | - |
tt2004/tt050104.htm | May 2004, A Simple Spark Gap EMI Source |
tt2004/tt060104.htm | - |
tt2004/tt070104.htm | July 2004, Induced Voltages via Electric and Magnetic Fields - ESD Immunity |
tt2004/tt080104.htm | August 2004, Wi-Fi (Wireless LAN) Antenna Response to EMI from Small Metal ESD |
tt2004/tt090104.htm | September 2004, Mobile Phone Response to EMI from Small Metal ESD |
tt2004/tt100104.htm | October 2004, Active Probe Design Philosophy |
tt2004/tt110104.htm | November 2004, Crosstalk Between Oscilloscope Channels and Other Errors |
tt2004/tt120104.htm | December 2004, Locating ESD and Other Impulsive Events |
tt2005/tt010105.htm | January 2005, Crossing Ground Plane Breaks - Part 4, Risetime Effects on Signals |
tt2005/tt020105.htm | February 2005, Crossing Ground Plane Breaks - Part 5, Common Mode Currents and Emissions |
tt2005/tt030105.htm | March 2005, Shielded Cables: Measurement of Shield Characteristics |
tt2005/tt040205.htm | April 2005, Inductive and Capacitive Coupling - Induced Current Characteristics |
tt2005/tt050105.htm | May 2005, Verifying Current Measurements - Revisited |
tt2005/tt060105.htm | June 2005, Analysis of the IEC 61000-4-4 Capacitive Clamp Using Current Measurements |
tt2005/tt070405.htm | July 2005, Radiated Interference to High Frequency Signal Measurements from the Signal Source |
tt2005/tt080105.htm | August 2005, Off-spec Use of Protection Components |
tt2005/tt090105.htm | September 2005, Multiple Turn and Single-turn Ferrite Chokes Compared |
tt2005/tt100105.htm | October 2005, Controlling Variables in High Frequency Tests and Measurements - an ESD Example |
tt2005/tt110105.htm | November 2005, Coupling Signals and Noise into Circuits Using Magnetic Loops - A Troubleshooting Technique |
tt2005/tt120105.htm | December 2005, Applying Copper Foil Tape to a Metal Surface |
tt2006/tt010106.htm | January 2006, A Small Change Can Have a Large Effect |
tt2006/tt020106.htm | February 2006, Construction of a Coaxial Antenna for Troubleshooting |
tt2006/tt030106.htm | March 2006, Predicting Cable Emissions from Common Mode Current |
tt2006/tt040506.htm | April 2006, Routing Signals Between PWB Layers - Part One, An ESD Example |
tt2006/tt050106.htm | May 2006, Routing signals Between PWB Layers - Part Two, An Emissions Example |
tt2006/tt060306.htm | June 2006, Measuring Structural Resonances |
tt2006/tt070506.htm | July 2006, A Small Change Can Have a Large Effect - Part Two |
tt2006/tt080106.htm | August 2006, A Measurement Technique for Locating EMI "Hot" Areas on Boards or Systems |
tt2006/tt090106.htm | September 2006, A Method for Improving the Repeatability of Air Discharges ad 8 kV and Higher |
tt2006/tt100106.htm | October 2006, Filtering Contact Discharges - Part 2, High Pass Filtering |
tt2006/tt110106.htm | November 2006, Measuring Signals in the Presence of Severe EMI - Part 1, How Not to Do It |
tt2006/tt120106.htm | December 2006, Measuring Signals in the Presence of Severe EMI - Part 2, A Differential Solution |
tt2007/tt010107.htm | January 2007, Measuring Signals in the Presence of Severe EMI - Part 3, Single Ended and Differential Probes |
tt2007/tt020107.htm | February 2007, Coupled Bonding Conductors (from Lightning Protection to Noise Reduction) |
tt2007/tt030407.htm | March 2007, Isolating Board and Chassis Grounds - A Potential Problem (An ESD Example) |
tt2007/tt040407.htm | April 2007, Rubber Band Theory of Circuit Design (explaining the effects of signal return paths with rubber bands) |
tt2007/tt050407.htm | May 2007, Placement of Parallel Capacitors on a Printed Wiring Board (for troubleshooting or a quick fix) |
tt2007/tt060207.htm | June 2007, Common Circuit Design Flaws That Cause Operational Problems (problems fixed long ago are still showing up in designs) |
tt2007/tt070407.htm | July 2007, Mobile Phone Induced Circuit Failure |
tt2007/tt080107.htm | August 2007, Mobile Phone Induced EMI |
tt2007/tt090407.htm | September 2007, Electronic Fluorescent Light Induced EMI |
tt2007/tt100107.htm | October 2007, Using Noise Injection for Troubleshooting Circuits |
tt2007/tt110107.htm | November 2007, Measuring Structural Resonances in the Time Domain - Part 1 |
tt2007/tt120307.htm | December 2007, Using Current Probes to Inject Pulses for Troubleshooting |
tt2008/tt010108.htm | January 2008, Using Current Probes to Measure Cable Resonance |
tt2008/tt020508.htm | February 2008, Using Resonant Frequency Measurements to Extract Circuit Parameters |
tt2008/tt030208.htm | March 2008, Measuring and Interpreting the Relative Phase of Common Mode Currents |
tt2008/tt040508.htm | April 2008, Measuring Structural Resonances - Part 2, Printed Wiring Board Traces |
tt2008/tt050408.htm | May 2008, The Square Shielded Loop - Part 1 |
tt2008/tt060208.htm | June 2008, The Square Shielded Loop - Part 2, Parasitic Coupling |
tt2008/tt070508.htm | July 2008, The Square Shielded Loop - Part 3, Parasitic Coupling Between Unshielded Wire Loops |
tt2008/tt080108.htm | August 2008, The Square Shielded Loop - Part 4, Coupling to a PCB |
tt2008/tt090108.htm | September 2008, The Square Shielded Loop - Part 5, Measurements in the Time Domain |
tt2008/tt100108.htm | October 2008, Minimizing ESD Events Involving Electronic Equipment |
tt2008/tt110108.htm | November 2008, Switching Power Supply Noise - Magnetic Fields Revisited |
tt2008/tt120108.htm | December 2008, Inexpensive Protective Caps for SMA and BNC Connectors |
tt2009/tt010109.htm | January 2009, Injection of ESD Current into Cables Using Capacitance |
tt2009/tt020309.htm | February 2009, PCB Protection can be Compromised by Ground Structure |
tt2009/tt030309.htm | March 2009, Using Current Probes to Inject Pulses for Troubleshooting - Part 2 |
tt2009/tt040109.htm | April 2009, Construction of a Series 50 Ohm Termination |
tt2009/tt050609.htm | May 2009, Using a Series 50 Ohm Termination With a High Voltage Transient Generator |
tt2009/tt060809.htm | June 2009. Effect of High Voltage Pulses on Resistors - ESD and EFT |
tt2009/tt070509.htm | July 2009, Can a Near Field Measurement Predict Far Field Emissions? |
tt2009/tt080609.htm | August 2009, The Square Shielded Loop - Part 6, Measurements in the Time Domain Using a Comb Generator |
tt2009/tt090609.htm | September 2009, Using a Two AA Cell USB Charger to Power a Comb Generator |
tt2009/tt100409.htm | October 2009, Using a Comb Generator to Demonstrate Impairment of the Shielding Effectiveness of a Coaxial Cable |
tt2009/tt110709.htm | November 2009, Using a Comb Generator With a Pair of Current Probes to Measure Cable Resonance |
tt2009/tt120609.htm | IEEE Std 802.3™-2002 Cable Clamp |
tt2010/tt010110.htm | January 2010, Using Current Probes to Inject Pulses for Troubleshooting (Board Resonances) - Part 3 |
tt2010/tt020310.htm | February 2010, Damping Board Resonances Using Discrete Resistors |
tt2010/tt030410.htm | March 2010, Damping Board Resonances Using Discrete Resistors - Part 2 |
tt2010/tt040210.htm | April 2010, Identifying Switching Power Supply Noise in Systems |
tt2010/tt050710.htm | May 2010, A Travel Tip for Engineers and Technicians |
tt2010/tt060310.htm | June 2010, Routing Signals Between PCB Layers - Part Three, Interplane Voltage |
tt2010/tt070610.htm | July 2010, Routing Signals Between PCB Layers - Part Four, Interplane Voltage |
tt2010/tt080410.htm | August 2010, Construction of a Coaxial Antenna for Troubleshooting - Part 2, Practical Implementation |
tt2010/tt090210.htm | September 2010, In ESD Testing, Necessity is the Mother of Invention |
tt2010/tt100210.htm | October 2010, Measurement and Evaluation of SATA Cables |
tt2010/tt110210.htm | Novermber 2010, Comparison of Current Waveforms from 150 Ohm and 330 Ohm Networks in an IEC 61000-4-2 Simulator |
tt2010/tt120210.htm | December 2010, Comparing "IEC 61000-4-2 Compliant" ESD Simulators |
tt2011/tt010411.htm | January 2011, Using Averaging to Cleanup Scope Waveforms |
tt2011/tt020511.htm | February 2011, Using High Frequency Current Measurements to Find Secondary ESD in Equipment |
tt2011/tt030211.htm | March 2011, Using High Frequency Measurement of ESD Current to Find Problems with an ESD Simulator |
tt2011/tt040711.htm | April 2011, Variability of Air Discharge ESD Current Waveforms |
tt2011/tt050411.htm | May 2011, Constructing a Shield for an IC Package to Troubleshoot Circuit Problems |
tt2011/tt060811.htm | June 2011, Useful Toolkit for Troubleshooting and Characterizing Circuits |
tt2011/tt070811.htm | July 2011, Measuring ESD Stress on a PCB |
tt2011/tt080111.htm | August 2011, Power Over Ethernet Injectors Can Affect Ethernet Radiated Emissions |
tt2011/tt090611.htm | September 2011, PCB-Chassis Ground Connections - Avoiding Pitfalls Due to Unintended System Resonances |
tt2011/tt100111.htm | October 2011, Electromagnetic Interference (EMI) Effects on Measurement Equipment |
tt2011/tt110111.htm | November 2011, Construction of a Tool for Removing Static Charges During ESD Testing |
tt2011/tt120111.htm | December 2011, Measuring the Resonant Frequencies of Heat Sink Tines |
tt2012/tt010212.htm | January 2012, Measuring Common Mode Currents to Troubleshoot EMC Problems |
tt2012/tt020812.htm | February 2012, The Melted BNC Adapter |
tt2012/tt030712.htm | March 2012, Air Discharge ESD Current Waveforms Revisited |
tt2012/tt041012.htm | April 2012, Single Point Grounding - Not Achievable at High Frequencies |
tt2012/tt052212.htm | May-June 2012, Destroying Electronic Components from Across the Room With ESD |
tt2012/tt072212.htm | July 2012, Measuring Breakdown Voltage With an ESD Simulator |
tt2012/tt081012.htm | August 2012, Novel Equivalent Circuit for Zin of an Arbitrarily Terminated Transmission Line |
tt2012/tt091612.htm | September 2012, Measuring Breakdown Voltage and Charging Objects With an ESD Simulator - Part 2 |
tt2012/tt102612.htm | October/November 2012, A Collection of Published Papers and Technical Tidbits on ESD Design and Troubleshooting |
tt2012/tt120212.htm | December 2012, A Collection of Published Papers and Technical Tidbits on EMC Design and Troubleshooting |
tt2013/tt020613.htm | February 2013, LVDS, Be Careful of EMI Induced Signal Corruption |
tt2013/tt042013.htm | April 2013, Human Metal vs. Human Body ESD |
tt2013/tt060213.htm | June 2013, A Collection of Measurements of ESD Types |
tt2013/tt072113.htm | July 2013, Human Metal ESD Characteristics, Size of Metal Object |
tt2013/tt090813.htm | September 2013, Parasitic Resonance in an ~10 MHz RFID Antenna - Measurement and Characterization |
tt2013/tt110113.htm | November 2013, Analog Designer's Notebook Part 1 - Improving Op Amp RF Immunity |
tt2014/tt010114.htm | Analog Designer's Notebook Part 2 - The Importance of Good Power Bypassing |
tt2014/tt040114.htm | March-April 2014, Troubleshooting Radiated and Conducted Immunity Problems in the Development Lab |
tt2014/tt060114.htm | June 2014, Radiated Emissions Can be Strongly Affected by Setup, A Problem for Testing Standards |
tt2014/tt081914.htm | August 2014, Radiated Emissions can be Strongly Affected by Driving Signals, A Problem for Emissions Testing |
tt2014/tt090114.htm | September 2014, Human Metal Model ESD Compared to Direct Skin Discharge (Human Body Model) ESD |
tt2014/tt100914.htm | October 2014, Direct RF Injection for Circuit Debugging |
tt2014/tt120214.htm | December 2014, EMC and Other Test Lab Errors |
tt2015/tt061616.htm | June 2015, ESD and EFT Internally Regenerated by Power Supplies |
tt2015/tt100915.htm | October 2015, Techniques for Investigating the Effects of ESD on Electronic Equipment |
tt2016/tt052416.htm | June 2016, Measuring Current of a High Voltage Discharge |
tt2019/tt021419.htm | February 2019, A Useful E-Field Near Field Probe for Troubleshooting |
talks/uesd-a.pdf | Unusual Forms of ESD and Effects on Electronic Equipment |
talks/pwbesd.pdf | Printed Wiring Board Immunity to ESD |
talks/hfovervw.pdf | Overview of High Frequency Measurement Techniques |
talks/imeas.pdf | Current Measurements |
talks/eft2000.pdf | Electrical Fast Transient Testing - Principles, Test Tips, and Unusual Uses for EFT Generators |
talks/hfprobe.pdf | Visuals for 1 GHz probe building sessions held at various IEEE EMC Society Chapters |
hdwlinks.htm | Hardware links |
pdf/denver99.pdf | Rocky Mountain EMC Society Probe Talk |
links/services.htm | Service Links |
links/esd-cntl.htm | ESD Control Links |
hfmcweb.htm | HF Measurement Seminar |
semdemos.htm | Seminar Demonstrations |
semroom.htm | Seminar Room Setup |
bio.htm | Short Biography |
publish.htm | Published Works |
longbio.htm | Detailed Biography |
earlyrs.htm | The Early Years |
veldhovn/veldhovn.htm | Pictures of Veldhoven, Netherlands, site of the IEC SC77B meetings, October 1999 |
zug/zug.htm | Pictures of Zug, Switzerland, site of the IEC TC77B meetings, April 2000 |
losgatos/index.htm | Pictures of Los Gatos, CA, site of High Frequency Measurement/Design Seminar in California |
events/eos2000/eos2000.htm | Pictures of the 2000 EOS/ESD Symposium in Anaheim, California, USA |
events/iec1000/index.htm | Pictures of Cambridge, MA, USA, site of the IEC TC77B meetings, October 2000 |
pictures/uk2001/uk2001.htm | Pictures of London and Oxford, June 2001 |
events/emc2001/index.htm | Pictures of Montreal and the 2001 IEEE EMC Symposium |
events/eos2002/index.htm | Pictures of Charlotte, NC and the 2002 EOS/ESD Symposium |
events/iec1102/index.htm | Pictures of Chandler, AZ, USA and the IEC TC77b meeting, November 2002 |
tt2019/tt061719.htm | - |
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Admin Phone Ext:
Admin Fax: 702-570-6013
Admin Fax Ext:
Admin Email: doug@dsmith.org
Registry Tech ID:
Tech Name: Concentric Network Corporation
Tech Organization: Joe Stan
Tech Street: 1400 Parkmoor Ave
Tech City: San Jose
Tech State/Province: CA
Tech Postal Code: 95126
Tech Country: US
Tech Phone: 408-817-2800
Tech Phone Ext:
Tech Fax: - - - 408-817-2810
Tech Fax Ext:
Tech Email: administrator@@vwbrown.com
Name Server: NS1.CNCHOST.COM
Name Server: NS2.CNCHOST.COM
>>> Last update of whois database: Mon, 19 May 2014 15:40:34 UTC <<<
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США - Линн - 69.84.133.101
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ColoSpace
HTTP/1.1 200 OK
Date: Thu, 02 Jan 2020 14:16:16 GMT
Server: Apache
Upgrade: h2,h2c
Connection: Upgrade
Last-Modified: Sat, 16 Nov 2019 01:03:54 GMT
ETag: "3a20164-146a6-5976c49da2cf5"
Accept-Ranges: bytes
Content-Length: 83622
Vary: Accept-Encoding,User-Agent
Content-Type: text/html
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